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SPDT Engineering, Assembly, and Laser Metrology Laboratory

SEAL Lab

The team is spearheading the development of manufacturing capabilities for metallic optics for astronomical and space instruments, with the first and most complex 5-axis ultra-precision single-point diamond-turning facilities in Southeast Asia. Partnering with world-class research institutes in the UK and the US, we transfer and localize technologies in machining and manufacturing freeform optics for astronomical uses and space missions. We aim to be the regional leader in ultra-precision (nanometer-scale) metallic reflective optics for both astronomical instrumentation and industrial solutions.

Diamond turning of a mirror substrate on the Freeform L
Diamond turning of a mirror substrate on the Freeform L

Capabilities

Numbers the lab commits to, measured on its own metrology bench.

CAPABILITYVALUEAPPLIES TONOTES
Surface roughness (diamond turning)Ra < 5 nm5-axis SPDT machineFrom the EAMA11 poster
Form accuracy (diamond turning)PV < λ/65-axis SPDT machineFrom the PI's CV (Sep 2026)
Ultra-precision machining5-axis single-point diamond-turning machine in a temperature-controlled enclosureMachine
Surface metrology3D surface profilers; ultra-precision CMMMetrology benchSurface-quality tester added in FY69
Environmental testingCryo-cycling chamber; vacuum ovenProcess
Production lineDesign → CNC → polishing → SPDT → metrology (TRL 6)Process
Precitech Freeform L

Freeform L, 5-axis SPDT

Ø ≤ 650 mm, form < 0.125 µm PV, micro-milling and grinding.

Zygo DynaFiz interferometer

DynaFiz interferometry + ZeGage profilometry

Form and roughness verification down to 0.15 nm Sq.

Coating chamber

High-vacuum coating

Reflective coatings verified by spectrophotometry over 400–700 nm.

Selected papers

Full list by year →

2026
Single point diamond turning capability for the next generation astronomical instruments in Thailand
Intaros, T.; Chanchaiworawit, K.; Ruenarrom, P.; Tanun, S.; Tinyanont, S.; et al.
Proc. SPIE 14154, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation VII · 14154, 141547Y · Conference proceedings